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Mots clés
Oxidation
AC susceptibility
Al2O3
Aluminum
Nanostructures
Capillary condensation
Nickel
Epitaxy
GaMnAs
Gold
Adsorption
RBS
HfO2
Epitaxial growth
EPR
6855Jk
Adsorbed layers
Growth
Kossel diffraction
XPS
8140Ef
Stable isotopic tracing
Ageing
Measurement
Adsorption Isotherms
ALD
Energy loss
Silicon Carbide
Metal-insulator transition
Ion beam analysis
Defects
15N
7550Pp
Auger electron spectroscopy AES
Annealing
Hysteresis
Acoustic propreties of solid
NRP
7630Lh
18O resonance
Diffusion
Multilayer
Indium oxide
Isotopic Tracing
Rutherford backscattering spectrometry RBS
XRD
Silica
2H
Evaluation
Pulsed laser deposition
13C
Magnetization curves
Nuclear reaction analysis
27Aldp
17Op
Photoluminescence
3C-SiC
Passivation
Pb centers
Interface defects
ADSORPTION DESORPTION HYSTERESIS
Nuclear resonance profiling NRP
Atomic Layer Deposition ALD
Magnetic anisotropy
Zinc oxide
Nanoparticles
AFM
SiC
7550Ee
Ion implantation
Gallium oxide
PIXE
Density functional theory
Oxygen deficiency
Topological insulators
Magnetic semiconductors
Sputtering
Ferromagnetic resonance
X-ray diffraction
Alloys
Periodic multilayer
Transparent conductive oxide TCO
Silicon carbide
Aluminium
Charge exchange
18O
17O
Topological defects
17Opp
27Alda
Low energy electron diffraction LEED
Nitridation
Raman spectroscopy
Silicon
Channeling
Acoustic
27Ald p&α
Alloy
Thin films
Thin film