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Communication Dans Un Congrès Année : 2024

Special Session: Reliability Assessment Recipes for DNN Accelerators

Alberto Bosio
Maksim Jenihhin
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  • PersonId : 1120111
Jaan Raik

Résumé

Reliability assessment is mandatory to guarantee the correct behavior of DNN hardware accelerators in safety-critical applications. While fault injection stands out as a well-established, practical and robust method for reliability assessment, it is still a very time-consuming process. This paper contributes with three recipes for optimizing the efficiency of the reliability assessment: a) hybrid analytical and hierarchical FI-based reliability assessment for systolic-array-based DNN accelerators; b) mixing techniques for the reliability assessment of in-chip AI accelerators in GPUs; c) reliability assessment of DNN hardware accelerators through physical fault injection. The experimental results demonstrate the efficiency of the proposed methods applied to their target DNN HW accelerator platforms.
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hal-04572731 , version 1 (12-05-2024)

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Mohammad Hasan Ahmadilivani, Alberto Bosio, Bastien Deveautour, Fernando Fernandes dos Santos, Juan David Guerrero Balaguera, et al.. Special Session: Reliability Assessment Recipes for DNN Accelerators. VTS 2024 - IEEE VLSI Test Symposium, Apr 2024, Tempe AZ USA, United States. pp.131788 - 131828, ⟨10.1109/access.2022.3229767⟩. ⟨hal-04572731⟩
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